Discover Frequent Patterns from Academic Data Of Student Information System. Journal of Pure & Applied Sciences , [S. l.], v. 23, n. 1, p. 55–57, 2024. DOI: 10.51984/jopas.v23i1.2848. Disponível em: https://sebhau.edu.ly/journal/jopas/article/view/2848. Acesso em: 19 jan. 2026.