Numerical Investigation of a PEC-Backed PVDF/MWCNT/Fe₃O₄ Nanocomposite Microwave Absorber in the X–Ku Band Using HFSS Floquet-Port Simulation
DOI:
https://doi.org/10.51984/3fv3gg10Keywords:
microwave absorber, PVDF, MWCNT, Fe₃O₄, reflection loss, HFSS, Floquet port, X-Ku band, impedance matchingAbstract
Growing electromagnetic interference (EMI) and radar-signature concerns in the X and Ku microwave bands (8-18 GHz) have renewed interest in thin, lightweight, absorption-dominated composite materials as an alternative to bulky metallic shields. This work presents a numerical design study of a PVDF/MWCNT/Fe3O4 nanocomposite absorber backed by a perfect electric conductor (PEC) plane. A dispersive material model was built from representative low-frequency electromagnetic data combined with a Fe3O4-driven magnetic resonance placed at 14.5 GHz, and reflection loss was computed using the transmission-line model (TMM), the exact analytical solution for a homogeneous slab at normal incidence. A thickness sweep from 1.0 to 2.5 mm revealed a sharp, narrow band resonance instead of a gradual thickness-dependent trend. The best configuration, at 1.61 mm, reached a minimum reflection loss of -58.6 dB at 11.34 GHz, well beyond the -20 dB (99% absorption) target and deeper than comparable double and triple filler absorbers reported in the literature at similar thicknesses. The resonance arises from quarter-wavelength geometric matching coinciding with a loss tangent already elevated on approach to the assumed magnetic resonance, and it proved highly sensitive to thickness, with minimum reflection loss (RLmin) varying by over 30 dB across a 0.4 mm window, a finding with direct implications for manufacturing tolerance. These results were cross checked against an initial HFSS Floquet-port simulation, which was found to require a finer mesh before it can serve as independent verification this remains ongoing work, alongside experimental validation of the electromagnetic input data above 12 GHz.
Downloads
Published
Issue
Section
License
Copyright (c) 2026 Sebha University Conference Proceedings

This work is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.